ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis

ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis

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PrintbegrAbnsninger: Der kan printes 10 sider ad gangen og max. 40 sider pr. sessionThere are several possible solutions to make the layout robust against the latch- up: 1. ... 1984 [3] F.Stellari, P.Song, A.J.Weger, M.K.McManus, R.Gauthier, P. Sanda - IBM Group a€œElectrical and Optical Characterization of Latchupa€ Microelectronic Failure ... testa€ Electronic Industries Association, March 1997 [5] A .Sedra, K.Smith, a€œMicroelectronc Circuitsa€ Oxford University Press, 5th Edition 2004 die positionanbsp;...


Title:ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis
Author: ASM International
Publisher:ASM International - 2007
ISBN-13:

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